Title: Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories
Authors: Suhane, Amit ×
Arreghini, Antonio
Van den Bosch, Geert
Vandelli, Luca
Padovani, Andrea
Breuil, Laurent
Larcher, Luca
De Meyer, Kristin
Van Houdt, Jan #
Issue Date: Sep-2010
Publisher: IEEE
Series Title: IEEE Electron Device Letters vol:31 issue:9 pages:936-938
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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