Title: Radiation damage in proton-irradiated strained Si n-MOSFETs
Authors: Hayama, K ×
Takakura, K
Ohtani, T
Kudou, T
Ohyama, H
Mercha, Abdelkarim
Simoen, Eddy
Claeys, Cor #
Issue Date: Oct-2008
Publisher: Elsevier
Series Title: Materials Science in Semiconductor Processing vol:11 issue:5-6 pages:314-318
ISSN: 1369-8001
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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