|ITEM METADATA RECORD
|Title: ||Reliability performance characterization of SOI FinFETs|
|Authors: ||Claeys, Cor|
Simoen, Eddy #
|Issue Date: ||2009 |
|Host Document: ||Proceedings of the 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST|
|Conference: ||2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST location:Mumbai India date:1-jun-2009|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
Electrical Engineering - miscellaneous
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