ITEM METADATA RECORD
Title: Reliability performance characterization of SOI FinFETs
Authors: Claeys, Cor
Put, Sofie
Rafi, J.M
Pavanello, J.M
Martino, J.A
Simoen, Eddy #
Issue Date: 2009
Host Document: Proceedings of the 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST
Conference: 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST location:Mumbai India date:1-jun-2009
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
# (joint) last author

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