Title: Investigation of intragrain defects in pc-Si layers obtained by aluminium-induced crystallization: comparison of layers made by low and high temperature epitaxy
Authors: Van Gestel, Dries ×
Dogan, Pinar
Gordon, Ivan
Bender, Hugo
Lee, K.Y
Beaucarne, Guy
Gall, Stefan
Poortmans, Jef #
Issue Date: Mar-2009
Publisher: Elsevier Sequoia
Series Title: Materials Science and Engineering B, Advanced Functional Solid-state Materials vol:159-160 pages:134-137
ISSN: 0921-5107
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - ELECTA, Electrical Energy Computer Architectures
× corresponding author
# (joint) last author

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