ITEM METADATA RECORD
Title: Stress analysis on ultra thin ground wafers
Authors: Cotrin Teixeira, Ricardo ×
De Munck, Koen
De Moor, Piet
Baert, Kris
Swinnen, Bart
Van Hoof, Chris
Knüettel, Alexander #
Issue Date: 2008
Publisher: Sociedade Brasileira de Computacao
Series Title: Journal of Integrated Circuits and Systems vol:3 issue:2 pages:83-89
ISSN: 1807-1953
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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