|ITEM METADATA RECORD
|Title: ||Electrical activity of dislocations and defects in strained Si and Ge based devices|
|Authors: ||Simoen, Eddy|
Bargallo Gonzalez, Mireia
Claeys, Cor #
|Issue Date: ||2008 |
|Host Document: ||SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices vol:16 issue:10 pages:513-527|
|Conference: ||SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices location:Honolulu, HI USA date:13-okt-2008|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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