|ITEM METADATA RECORD
|Title: ||Failure mechanisms for semiconductor atom probe tips|
|Authors: ||Koelling, Sebastian|
Vandervorst, Wilfried #
|Issue Date: ||2008 |
|Conference: ||51st International Field Emission Symposium location:Rouen France date:29-jun-2008|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Nuclear and Radiation Physics Section|
|Files in This Item:
There are no files associated with this item.
All items in Lirias are protected by copyright, with all rights reserved.