Title: Failure mechanisms for semiconductor atom probe tips
Authors: Koelling, Sebastian
Vandervorst, Wilfried #
Issue Date: 2008
Conference: 51st International Field Emission Symposium location:Rouen France date:29-jun-2008
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Nuclear and Radiation Physics Section
# (joint) last author

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