Title: Failure mechanisms of silicon-based atom probe tips
Authors: Koelling, Sebastian ×
Vandervorst, Wilfried #
Issue Date: Apr-2009
Publisher: Elsevier
Series Title: Ultramicroscopy vol:109 issue:5 pages:486-491
Conference: International Field Emission Symposium edition:5 date:2008
ISSN: 0304-3991
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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