Title: Characterization and optimization of sub-32nm FinFET devices for ESD applications
Authors: Thijs, Steven ×
Tremouilles, David
Russ, Christian
Griffoni, Alessio
Collaert, Nadine
Rooyackers, Rita
Linten, Dimitri
Scholz, Mirko
Duvvury, Charvaka
Gossner, Harald
Jurczak, Malgorzata
Groeseneken, Guido #
Issue Date: Dec-2008
Publisher: IEEE
Series Title: IEEE Transactions on Electron Devices vol:55 issue:12 pages:3507-3516
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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