Title: Significant reduction of positive bias temperature instability in high-k/metal-gate nFETs by incorporation of rare earth metals
Authors: Kaczer, Ben ×
Veloso, Anabela
Aoulaiche, Marc
Groeseneken, Guido #
Issue Date: Jun-2009
Publisher: Elsevier
Series Title: Microelectronic Engineering vol:86 issue:7-9 pages:1894-1896
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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