Title: A deep-level transient spectroscopy study of silicon interface states using different silicon nitride surface passivation schemes
Authors: Gong, Chun ×
Simoen, Eddy
Posthuma, Niels
Van Kerschaver, Emmanuel
Poortmans, Jef
Mertens, Robert #
Issue Date: 2010
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:96 issue:10 pages:103507
Article number: 103507
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - ELECTA, Electrical Energy Computer Architectures
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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