Title: SPICE modelling of hot-carrier degradation in Si1‚ÄìxGex S/D and HfSiON based pMOS transistors
Authors: Martin Martinez, Javier ×
Amat, Esteve
Bargallo Gonzalez, Mireia
Verheyen, Peter
Rodriguez, Rosana
Nafria, Montse
Aymerich, Xavier
Simoen, Eddy #
Issue Date: Sep-2010
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:50 issue:9-11 pages:1263-1266
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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