Title: NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurement
Authors: Ji, Zhigang ×
Lin, L
Zhang, Jian Fu
Kaczer, Ben
Groeseneken, Guido #
Issue Date: Jan-2010
Publisher: IEEE
Series Title: IEEE Transactions on Electron Devices vol:57 issue:1 pages:228-237
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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