Title: Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs
Authors: Griffoni, Alessio ×
Thijs, Steven
Russ, Christian
Tremouilles, David
Linten, Dimitri
Scholz, Mirko
Simoen, Eddy
Claeys, Cor
Meneghesso, Gaudenzio
Groeseneken, Guido #
Issue Date: Mar-2010
Publisher: IEEE
Series Title: IEEE Transactions on Device and Materials Reliability vol:10 issue:1 pages:130-141
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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