Title: Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
Authors: Amat, Esteve ×
Kauerauf, Thomas
Degraeve, Robin
Rodríguez, Rosana
Nafría, Montse
Aymerich, Xavier
Groeseneken, Guido #
Issue Date: Jan-2010
Publisher: Elsevier
Series Title: Microelectronic Engineering vol:87 issue:1 pages:47-50
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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