Title: A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique
Authors: Ruiz Aguado, Daniel ×
Govoreanu, Bogdan
Zhang, W.D
Jurczak, Malgorzata
De Meyer, Kristin
Van Houdt, Jan #
Issue Date: Oct-2010
Publisher: IEEE
Series Title: IEEE Transactions on Electron Devices vol:57 issue:10 pages:2726-2735
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science