Title: Interface/bulk trap recovery after submeltl aser anneal and the impact to NBTI reliability
Authors: Cho, Moon Ju ×
Aoulaiche, Marc
Degraeve, Robin
Ortolland, Claude
Kauerauf, Thomas
Kaczer, Ben
Roussel, Philippe
Hoffmann, Thomas Y
Groeseneken, Guido #
Issue Date: Jun-2010
Publisher: IEEE
Series Title: IEEE Electron Device Letters vol:31 issue:6 pages:606-608
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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