|ITEM METADATA RECORD
|Title: ||Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing|
|Authors: ||Zahid, Mohammed ×|
Van Houdt, Jan #
|Issue Date: ||Oct-2010 |
|Series Title: ||IEEE Electron Device Letters vol:31 issue:10 pages:1158-1160|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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