Title: Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing
Authors: Zahid, Mohammed ×
Arreghini, Antonio
Degraeve, Robin
Govoreanu, Bogdan
Suhane, Amit
Van Houdt, Jan #
Issue Date: Oct-2010
Publisher: IEEE
Series Title: IEEE Electron Device Letters vol:31 issue:10 pages:1158-1160
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science