Title: Micro-uniformity during laser anneal: metrology and physics
Authors: Vandervorst, Wilfried
Rosseel, Erik
Lin, R
Petersen, D.H
Clarysse, Trudo
Goossens, Jozefien
Nielsen, P.F
Churton, K #
Issue Date: 2008
Host Document: Doping Engineering for Front-End Processing pages:1070-E01-10
Conference: Doping Engineering for Front-End Processing location:San Francisco, CA USA date:24-mrt-2008
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Nuclear and Radiation Physics Section
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science