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Title: Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Authors: Martin-Martinez, Javier
Kaczer, Ben
Boix, J
Ayala, N
Rodriguez, Rosana
Nafria, Montserrat
Aymerich, X
Zuber, Paul
Dierickx, Bart
Groeseneken, Guido #
Issue Date: Feb-2009
Host Document: Proceedings of the Spanish Conference on Electron Devices - CDE pages:156-159
Conference: Spanish Conference on Electron Devices - CDE location:Santiago de Compostela Spain date:11-feb-2009
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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