Title: Impact of interface state trap density on the performance characteristics of different III‚ÄìV MOSFET architectures
Authors: Benbakhti, Brahim ×
Ayubi-Moak, J.S
Kalna, Karol
Lin, Dennis
Hellings, Geert
Brammertz, Guy
De Meyer, Kristin
Thayne, I
Asenov, Asen #
Issue Date: Mar-2010
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:50 issue:3 pages:360-364
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Department of Materials Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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