Title: On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells
Authors: Loozen, Xavier ×
O'Sullivan, Barry
Rothschild, Aude
Vermang, Bart
John, Joachim
Gordon, Ivan #
Issue Date: Dec-2010
Publisher: Wiley
Series Title: Physica Status Solidi. Rapid Research Letters vol:4 issue:12 pages:362-364
ISSN: 1862-6254
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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