Title: High temperature on- and off-state stress of GaN-on- Si HEMTs with in-situ Si3N4 cap layer
Authors: Marcon, Denis
Medjdoub, Farid
Visalli, Domenica
Van Hove, Marleen
Derluyn, Joff
Das, Jo
Degroote, Stefan
Leys, Maarten
Cheng, Kai
Decoutere, Stefaan
Mertens, Robert
Germain, Marianne
Borghs, Gustaaf #
Issue Date: 2010
Host Document: Proceedings of the IEEE International Reliability Physics Symposium - IRPS pages:146-151
Conference: IEEE International Reliability Physics Symposium - IRPS location:Anaheim, CA USA date:2-mei-2010
ISBN: 978-1-4244-5431-0
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Semiconductor Physics Section
# (joint) last author

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