Title: A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
Authors: Cho, Moon Ju ×
Degraeve, Robin
Roussel, Philippe
Govoreanu, Bogdan
Kaczer, Ben
Zahid, Mohammed
Simoen, Eddy
Arreghini, Antonio
Jurczak, Malgorzata
Van Houdt, Jan
Groeseneken, Guido #
Issue Date: Nov-2010
Publisher: Pergamon
Series Title: Solid-State Electronics vol:54 issue:11 pages:1384-1391
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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