Title: Characterization of nickel silicides using EELS-based methods
Authors: Verleysen, Eveline
Bender, Hugo
Richard, Olivier
Schryvers, Dominique
Vandervorst, Wilfried #
Issue Date: Oct-2010
Publisher: Blackwell Science
Series Title: Journal of Microscopy vol:240 issue:1 pages:75-82
ISSN: 0022-2720
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
# (joint) last author

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