Title: Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime
Authors: Raffo, A
Di Falco, S
Sozzi, G
Menozzi, R
Schreurs, Dominique ×
Vannini, G #
Issue Date: Feb-2011
Series Title: Microelectronics Reliability vol:51 issue:2 pages:235-239
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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