Title: Enamel-Smear Compromises Bonding by Mild Self-Etch Adhesives
Authors: Mine, A ×
De Munck, Jan
Vivan Cardoso, Marcio
Van Landuyt, Kirsten
Poitevin, André
Kuboki, T
Yoshida, Y
Suzuki, K
Van Meerbeek, Bart #
Issue Date: Dec-2010
Publisher: Sage Publications, Inc.
Series Title: Journal of dental research vol:89 issue:12 pages:1505-1509
Article number: 10.1177/0022034510384871
Abstract: In light of the increased popularity of less acidic, so-called 'ultra-mild' self-etch adhesives, adhesion to enamel is becoming more critical. It is hypothesized that this compromised enamel bonding should, to a certain extent, be attributed to interference of bur debris smeared across enamel during cavity preparation. High-resolution transmission electron microscopy revealed that the enamel smear layer differed not only in thickness, but also in crystal density and size, depending on the surface-preparation method used. Lab-demineralization of sections clearly disclosed that resin-infiltration of an ultra-mild self-etch adhesive progressed preferentially along micro-cracks that were abundantly present at and underneath the bur-cut enamel surface. The surface-preparation method significantly affected the nature of the smear layer and the interaction with the ultra-mild adhesive, being more uniform and dense for a lab-SiC-prepared surface vs. a clinically relevant bur-prepared surface.
ISSN: 0022-0345
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Biomaterials - BIOMAT
Department of Oral Health Sciences - miscellaneous
× corresponding author
# (joint) last author

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