Title: Comparing EMC-Signatures by FSV as a Quality Assessment Tool
Authors: Knockaert, Jos
Pissoort, Davy
Vanhee, Filip #
Issue Date: Mar-2011
Host Document: Proceedings of Progress in Electromagnetic Research Symposium 2011 pages:1099-1103
Conference: PIERS 2011 edition:27 location:Marrakesh, Morocco date:March 2011
Abstract: Electromagnetic interference radiated by a consumer product is measured on a sample of similar devices under test. The EMC-signature of these devices can drift due to aging or deviations in manufacturing. It is proposed to use the Feature Selective Validation method to compare the emission from devices with a reference device in order to have a quality assessment tool.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
ESAT - ELECTA, Electrical Energy Computer Architectures
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Ostend
# (joint) last author

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