Blackwell Publishing on behalf of the International Union of Crystallography
Journal of Applied Crystallography vol:43 pages:352-355
CONEX is a Windows application for converting series of two-dimensional X-ray powder patterns measured on flat two-dimensional detectors into one-dimensional scattering patterns. It is based on the rigorous use of scattering patterns of calibration samples to determine the three-dimensional position of the detector, with respect to the sample and to the beam. This enables correction of the data for geometric distortions, even when the detector is highly tilted and not centred on the beam.