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Title: The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films
Authors: Fleischmann, Claudia ×
Almeida, F
Demeter, Joost
Paredis, Kristof
Teichert, A
Steitz, R
Brems, Steven
Opperdoes, Bastiaan
Van Haesendonck, Christian
Vantomme, André
Temst, Kristiaan #
Issue Date: Jun-2010
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:107 issue:11 pages:1-7
Article number: 113907
Abstract: We have investigated the correlation between magnetic and structural properties in exchange coupled polycrystalline CoO/Fe thin films. It has been found that an increase in interface roughness increases the exchange bias field as well as the coercivity. The magnetization reversal mechanism is also influenced by the interfacial morphology. Smooth interfaces are characterized by an asymmetric hysteresis loop, which is associated with domain wall motion for the first magnetization reversal after field cooling and spin rotation in all subsequent reversals. This asymmetry diminishes as the interface roughness increases, i.e., all magnetization reversals are dominated by spin rotation. Moreover, we have observed that the blocking temperature decreases with increasing interface roughness. We also report on a logarithmic time dependence of the magnetization which is different for both branches of the hysteresis loop of smooth CoO/Fe bilayers. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3391470]
URI: 
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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