Title: Detection and Electrical Characterization of Defects at the SiO2/4H-SiC Interface
Authors: Krieger, M
Beljakova, S
Zippelius, B
Afanas'ev, Valeri
Bauer, A. J.
Nanen, Y
Kimoto, T
Pensl, G #
Issue Date: 2010
Publisher: Trans Tech Publications
Host Document: Materials Science Forum vol:645-648 issue:1-2 pages:463-468
Conference: 13th International Conference on Silicon Carbide and Related Materials location:Nurnberg, GERMANY date:OCT 11-16, 2009
ISSN: 0255-5476
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
# (joint) last author

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