|ITEM METADATA RECORD
|Title: ||Detection and Electrical Characterization of Defects at the SiO2/4H-SiC Interface|
|Authors: ||Krieger, M|
Bauer, A. J.
Pensl, G #
|Issue Date: ||2010 |
|Publisher: ||Trans Tech Publications|
|Host Document: ||Materials Science Forum vol:645-648 issue:1-2 pages:463-468|
|Conference: ||13th International Conference on Silicon Carbide and Related Materials location:Nurnberg, GERMANY date:OCT 11-16, 2009|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Semiconductor Physics Section|
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