Title: The BOLD correlates of the visual P1 and N1 in single-trial analysis of simultaneous EEG-fMRI recordings during a spatial detection task
Authors: Novitskiy, Nikolay ×
Ramautar, J R
Vanderperren, Katrien
De Vos, Maarten
Mennes, M
Mijovic, Bogdan
Vanrumste, Bart
Stiers, Peter
Van den Bergh, Bea
Lagae, Lieven
Sunaert, Stefan
Van Huffel, Sabine
Wagemans, Johan #
Issue Date: Jan-2011
Publisher: Academic Press
Series Title: NeuroImage vol:54 issue:2 pages:824-835
Abstract: Simultaneous EEG-fMRI measurements can combine the high spatial resolution of fMRI with the high temporal resolution of EEG. Therefore, we applied this approach to the study of peripheral vision. More specifically, we presented visual field quadrant fragments of checkerboards and a full central checkerboard in a simple detection task. A technique called "integration-by-prediction" was used to integrate EEG and fMRI data. In particular, we used vectors of single-trial ERP amplitude differences between left and right occipital electrodes as regressors in an ERP-informed fMRI analysis. The amplitude differences for the regressors were measured at the latencies of the visual P1 and N1 components. Our results indicated that the traditional event-related fMRI analysis revealed mostly activations in the vicinity of the primary visual cortex and in the ventral visual stream, while both P1 and N1 regressors revealed activation of areas in the temporo-parietal junction. We conclude that simultaneous EEG-fMRI in a spatial detection task can separate visual processing at 100-200ms from stimulus onset from the rest of the information processing in the brain.
ISSN: 1053-8119
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Brain & Metabolism Section (-)
Health Psychology
ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
Laboratory for Experimental Psychology
Translational MRI (+)
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Geel
Electrical Engineering (ESAT) TC, Technology Campus Diepenbeek
× corresponding author
# (joint) last author

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