Title: A statistical approach to microdose induced degradation in FinFET devices
Authors: Griffoni, Alessio ×
Gerardin, S.
Roussel, Philippe
Degraeve, Robin
Meneghesso, G.
Paccagnella, A.
Simoen, Eddy
Claeys, Cor #
Issue Date: 2009
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:56 issue:6/1 pages:3285-3292
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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