Title: Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio
Authors: Kulkarni, S.R. ×
Schrimpf, R.D.
Galloway, K.F.
Arora, R.
Claeys, Cor
Simoen, Eddy #
Issue Date: 2009
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:56 issue:4 pages:1926-1930
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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