Title: Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Authors: Crupi, F ×
Giusi, G
Iannacone, G
Magnone, P
Pace, C
Simoen, Eddy
Claeys, Cor #
Issue Date: Oct-2009
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:106 issue:7
Article number: 073710
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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