Title: High sensitivity photoconductivity based measurement setup for the determination of effective recombination lifetime in silicon wafers
Authors: Cornagliotti, Emanuele ×
Kang, Xuanwu
Beaucarne, Guy
John, Joachim
Poortmans, Jef
Mertens, Robert Pierre #
Issue Date: 2009
Publisher: American Institute of Physics
Series Title: Review of Scientific Instruments vol:80 issue:5 pages:053906
ISSN: 0034-6748
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - ELECTA, Electrical Energy Computer Architectures
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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