International Conference on Extended Defects in Semiconductors (EDS 2008), Date: 2008/09/14 - 2008/09/19, Location: FRANCE, Poitiers
Publication date:
2009-01-01
Pages:
1912 -
1917
Publisher:
Wiley-VCH
Physica Status Solidi C
Author:
Simoen, Eddy
Brouwers, Gijs ; Yang, Rui ; Eneman, Geert ; Bargallo Gonzalez, Mireia ; Leys, Frederik ; De Jaeger, Brice ; Mitard, Jerome ; Brunco, David ; Souriau, Laurent ; Cody, Nyles ; Thomas, Shawn ; Lajaunie, Luc ; David, Marie-Laure ; Rabier, J ; LeBourhis, E
Keywords:
Science & Technology, Physical Sciences, Physics, Applied, Physics, Condensed Matter, Physics, INDUCED CURRENT CONTRAST, LEAKAGE CURRENT, DEFECTS, SILICON, LAYERS, PMOSFETS, BEHAVIOR, ALLOYS, 0204 Condensed Matter Physics, 0206 Quantum Physics, 0912 Materials Engineering, 4016 Materials engineering, 5104 Condensed matter physics