Title: 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Authors: Magnone, P. ×
Crupi, F.
Giusi, G.
Pace, C.
Simoen, Eddy
Claeys, Cor
Pantisano, Luigi
Maji, D.
Rao, V.R.
Srinivasan, P. #
Issue Date: Jun-2009
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:9 issue:2 pages:180-189
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science