Title: Impact of the Ge content on the bandgap-narrowing induced leakage current of recessed Si1-xGex source/drain junctions
Authors: Bargallo Gonzalez, Mireia ×
Simoen, Eddy
Vissouvanadin, B
Verheyen, Peter
Loo, Roger
Claeys, Cor #
Issue Date: Jul-2009
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:56 issue:7 pages:1418-1423
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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