ITEM METADATA RECORD
Title: Monitoring and backtesting churn models
Authors: Lima, E. ×
Mues, Christophe
Baesens, Bart #
Issue Date: 2010
Publisher: Pergamon
Series Title: Expert Systems with Applications vol:38 issue:1 pages:975-982
ISSN: 0957-4174
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Research Center for Management Informatics (LIRIS), Leuven
× corresponding author
# (joint) last author

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