Title: Detailed analysis of charge pumping and ldVg Hysteresis for profiling traps in SiO2/HfSiO(N)
Authors: Sahhaf, S ×
Degraeve, R
Cho, M
De Brabanter, Kris
Roussel, Ph.J
Zahid, M.B
Groeseneken, G #
Issue Date: 2010
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:87 issue:10 pages:2614-2619
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
× corresponding author
# (joint) last author

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