ITEM METADATA RECORD
Title: Exchange bias by implantation of O ions into Co thin films
Authors: Demeter, Joost ×
Meersschaut, J
Almeida, F
Brems, S
Van Haesendonck, Christian
Teichert, A
Steitz, R
Temst, Kristiaan
Vantomme, André #
Issue Date: Mar-2010
Publisher: Amer inst physics
Series Title: Applied physics letters vol:96 issue:13 pages:1-3
Article number: 132503
Abstract: An original approach for the formation of an exchange bias system is presented. Alternative to surface oxidation or deposition for the formation of Co/CoO bilayer exchange bias systems, implantation of oxygen ions into Co films is applied. The implantation results in the formation of CoxOy embedded in a Co matrix. Comparison with noble gas implantation unambiguously demonstrates that the observed exchange bias effect is induced by the implanted oxygen. Opposed to bilayers formed by surface oxidation, the implantation results in a different morphology of the interface between Co and CoxOy and also gives rise to a radically different magnetization reversal mechanism.
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science