|ITEM METADATA RECORD
|Title: ||Quantification of LEIS depth profiles|
|Authors: ||Creemers, Claude|
Schryvers, P #
|Issue Date: ||Dec-1994 |
|Conference: ||Quantification in Micro- and Surface Analysis location:Antwerp (Belgium) date:12 December 1994|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Process Engineering for Sustainable Systems Section|
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