|ITEM METADATA RECORD
|Title: ||Quantification of LEIS depth profiles: Demonstration of KUL-developed software|
|Authors: ||Creemers, Claude|
Schryvers, P #
|Issue Date: ||Dec-1995 |
|Conference: ||Factorial analysis in AES-XPS, workshop of the NFWO edition:1995 location:Brussels (Belgium) date:1 December 1995|
|Publication status: ||published|
|KU Leuven publication type: ||AMa|
|Appears in Collections:||Process Engineering for Sustainable Systems Section|
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