ITEM METADATA RECORD
Title: Quantification of LEIS depth profiles: Demonstration of KUL-developed software
Authors: Creemers, Claude
Schryvers, P #
Issue Date: Dec-1995
Conference: Factorial analysis in AES-XPS, workshop of the NFWO edition:1995 location:Brussels (Belgium) date:1 December 1995
Publication status: published
KU Leuven publication type: AMa
Appears in Collections:Process Engineering for Sustainable Systems Section
# (joint) last author

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