Title: Radiation damage of Ge-on-Si devices
Authors: Ohyama, H. ×
Sakamoto, K.
Sukizaki, H.
Takakura, K.
Hayama, K.
Motoki, M.
Matsuo, K.
Nakamura, H.
Sawada, M.
Midorikawa, M.
Kuboyama, S.
De Jaeger, Brice
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2008
Publisher: Pergamon
Series Title: Materials Science in Semiconductor Processing vol:11 issue:5-6 pages:217-220
ISSN: 1369-8001
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science