Title: Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
Authors: Guo, Wei ×
Cretu, B.
Routoure, J.-M.
Carin, R.
Simoen, Eddy
Mercha, Abdelkarim
Collaert, Nadine
Put, Sofie
Claeys, Corneel #
Issue Date: 2008
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:52 issue:12 pages:1889-1894
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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