Title: Improved generation lifetime model for the electrical characterization of single- and double-gate SOI nMOSFETs
Authors: Galeti, M. ×
Martino, J.A.
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2008
Publisher: IOP Pub.
Series Title: Semiconductor Science and Technology vol:23 pages:125011
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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