Title: On the correct extraction of interface trap density of MOS devices with high-mobility semiconductor substrates
Authors: Martens, Koen ×
Chui, Chi On
Brammertz, Guy
De Jaeger, Brice
Kuzum, Duygu
Meuris, Marc
Heyns, Marc
Krishnamohan, Tejas
Saraswat, Krishna
Maes, Herman
Groeseneken, Guido #
Issue Date: 2008
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:55 issue:2 pages:547-556
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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