Author:

Keywords:

LEIS, surface science, ordering, ion scattering

Abstract:

Owing to its extreme surface sensitivity Ion Scattering Spectroscopy can reveal under certain conditions a systematic and angle dependent shadowing of substrate atoms by an ordered two-dimensional overlayer. This phenomenon is used to perform a structural analysis of the different low index planes of ZnO. the I** plus //Z//n/I//0** plus yield ratio of the noble gas ions backscattered from Zn and O atoms respectively changes with the scattering angle theta and with the angle of incidence psi , and is directly related to the atomic arrangement in the surface unit mesh.