Title: Vector Two-Tone Measurements for Validation of Nonlinear Microwave FinFET Model
Authors: Crupi, Giovanni ×
Avolio, Gustavo
Schreurs, Dominique
Pailloncy, G.
Caddemi, A.
Nauwelaers, Bart #
Issue Date: Oct-2010
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:87 issue:10 pages:2008-2013
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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